LG Innotek detects design flaws using AI tech

South Korean electronic parts manufacturer LG Innotek announced on Tuesday it has implemented an artificial intelligence (AI) analysis system to quickly detect defects in semiconductor substrate designs. The strategy involves using AI to identify faults in substrate designs, thereby improving the initial yield of products.

LG Innotek has been applying AI to the pre-analysis of substrate designs for semiconductors, including "radio frequency system in package" (RF-SiP) and "antenna in package" (AiP), since the beginning of this month.

Previously, inspections were often limited to certain circuit areas of the designs, leading to issues being detected only after pilot production had begun, resulting in increased costs and lead times, which, in turn, lowered yields.

However, with the introduction of an AI pre-analysis system for design, LG Innotek can now thoroughly examine the entire design. The company completed AI development by inputting data on more than 16,000 circuit defects, revealing that AI could detect defects in designs in more than 90% of cases.

Write to Ik-Hwan Kim at lovepen@hankyung.com